HIOKI FA1116 Flying Probe Tester
Now with newly developed low-impact probes and precision soft-landing control, 30% faster cycle times for gold plating and fine pattern testing.
- High-Speed Testing at Up to 100 points/sec.
- Featuring newly designed probes and precision control for half the impact mark depth of previsous designs.
- Rapid testing, regardless of board type.
- Easily position the target board and start testing, even for thin-film boards and thick, round boards.
- Large Testing Aea of 610 (W) x 510 (D) mm.
- Support for 10 mm probe-up height.
- High-speed image processing system.
- High-speed pattern testing using capacitance measurement.
Manufacture ProcessTesting / Inspection / QA
ProductFA1116 Flying Probe Tester